Mark your calendars: A nationwide test of the Alert Ready, Canada’s National Public Alerting System, is scheduled for Wednesday, November 19, 2025. This mandatory, annual test ensures the system is ...
Testing inside the fab or packaging house can determine whether a chip or package meets all the functional requirements at time zero, but how that chip behaves in the field during its lifetime and ...
The Missile Defense Agency has awarded IERUS Technologies a $474.9 million cost-plus-fixed-fee contract to support testing and analysis for multiple radar platforms within the Missile Defense System.
The pool of companies will compete for task orders to provide computer-controlled diagnostic equipment to test military aircraft and weapons systems. Thirty-three companies won spots on a $980 million ...
DUGWAY PROVING GROUND, Utah – Dugway Proving Ground (DPG) played a crucial role in showcasing the capabilities of BAE Systems’ APKWS® laser-guidance kit during a test event earlier this year, firing ...
AEHR is a high-risk, high-reward binary play, with fiscal 2026 hugely important for the mid- to long-term investment case. The recent acquisition of Incal and AI processor exposure have repositioned ...
FIRST ON FOX: For the first time, U.S. fighter pilots took direction from an AI "air battle manager" in a Pentagon test that could change how wars are fought in the skies. The Air Force and Navy ran ...
'Issue with ground systems' forces scrub for Starship's tenth flight Stakes high for success after streak of testing failures this year Super Heavy booster was to attempt water landing off Texas coast ...
PORTLAND, Ore. (KATU) — People in the Portland metro area might have received an emergency alert test message on Thursday afternoon. Multnomah County planned to send a rare test of its wireless ...
NORFOLK, Va. (WAVY) – Old Dominion University, alongside the city of Norfolk, will celebrate the opening of their new ODU Maritime Autonomous Systems Test Site (MASTS) Friday, Aug. 8. The MASTS is ...
System-level test (SLT), once used largely as a stopgap measure to catch issues missed by automated test equipment (ATE), has evolved into a necessary test insertion for high-performance processors, ...
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